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The newly developed Advanced CD Measurement SEM CG6300 (HITACHI CD-SEM) will offer higher resolution with a fully renewed electron optical system along with Specifications for Hitachi Model S-4800, Field Emission Scanning Electron Microscope. 1. Resolution: Accelerating voltage 15 kV. Hitachi CD-SEM S-8820 Critical Dimension Scanning Electron Microscope :Used, Complete, working condition,Fully tested by seller, Silicon Valley, CA, U.S.A.. Hitachi S-9300 CD SEM • Manufacturer: Hitachi • Model: S-9300 • Wafer Size: 200mm Electron Optical System • Electron Gun: Schottky emission source D/N VARI-FOCAL IR CAMERA PIH-0364X/0368X/0384X/0388X W/S INSTRUCTION MANUAL IMPORTANT SAFEGUARDS 1. Read Instructions All the safety and operating instructions This manual is copyrighted by Hitachi High-Technologies to daily operation on the model S-3400N scanning electron microscope. The Hitachi S-7000 CD SEM is an in-process evaluation tool for monitoring wafers during the during the various process steps. Non-destructive wafer inspection