Biased hast why

Note that cyclic DC voltage is not the same as AC voltage. Typical test conditions are:. Delserro Engineering Solutions, Inc. DES has many years of experience performing HAST testing and can assist customers in setting up a test using the proper test conditions. So, if you do not know what test conditions that you should use or what specification to choose then we will help you because we are HAST experts!

Contact us or call Any mathematical model? What is the mathematical model you used? Use the Arrhenius-Peck Relationship. Your email address will not be published. This requires that the chamber be tightly sealed to prevent leaks. Testing is performed with or without a voltage bias on the samples. For a biased test, a DC voltage is applied to the samples. For semiconductors, the samples are placed in sockets located inside the test chamber. Wires inside of the chamber pass through a sealed feed-through where they are connected to power supplies located outside of the chamber.

The bias can be continuous or cyclic DC voltage. This process temporarily accelerates the infiltration of moisture into the device under test DUT.

HAST is considered by most semiconductor manufacturers to be a fast and reliable alternative to THB and is an important part of package qualifications. Introduction to Semiconductor Burn-In.